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我目前在我们实验室中的12端口扩展设置中出现了一些不稳定的行为。
这是N5230C与FW 09.46.xx上的U3042A E12装置配合使用。 我在~1GHz以下的所有单端对上得到的数据相对较差。 有趣的是，此行为仅在启用12端口扩展并跨所有端口时显示。 到目前为止，我已经尝试过：恢复旧固件尝试不同的电子校准单元交换跳线（当然这不会有帮助，因为它困扰所有测量）仔细检查我们的错误条款似乎是合理的（他们这样做）贯穿整个 没有电源孔的12端口扩展的故障排除指南。 这是我的第一次猜测，因为过去我们因为这个原因而遇到了问题。 我附上了两张图片：一张带有校准功能，一张带有校准功能，比较分析仪的性能，无论是否启用了跳线/多端口。 我使用S21来表明这不仅仅是扩展端口上的问题，只有当跳线通过多端口时。 正如我所说，这是困扰所有端口的任何东西。 在这种情况下，DUT是我们其中一个校准板上的小直通迹线。 还有什么我可以调查以隔离问题，或者是否有任何关于发生了什么的想法？ 我还提供了我拍的.s2p文件，虽然我可以提供一个.s16p文件，我也抓住了这个行为。 任何帮助将不胜感激S21WithoutCal.png24.8 KBNoMultiPortCalOn.s2p42.4 KBNoMultiPortCalOff.s2p46.4 KBMultiportWithCalOff.s2p46.4 KBMultiportWithCalOn.s2p42.2 KB 以上来自于谷歌翻译 以下为原文 I'm currently having some erratic behavior occurring with one of our 12-port extension setups we have in our lab. This is an N5230C mated to a U3042A E12 unit on the FW 09.46.xx. I'm getting some relatively poor data on all single-ended pairs under ~1GHz. Interestingly, this behavior only shows up when the 12-port extension is enabled and across all ports. So far I have tried: Reverting to old firmware Trying different electronic calibration units Swapping jumpers around (of course this wouldn't help, since its plaguing all measurements) Double-checking that our error terms seemed reasonable (and they do) Running through the troubleshooting guide for the 12-port extension with no power holes to be found. This would've been my first guess, as we've had problems with it for this very reason in the past. I've attached two images: one with calibration on, one with calibration off comparing the Analyzer's performance with and without the jumpers/multi-port enabled. I used S21 to show that this isn't an issue just with ports on the extension, only when the jumpers are run through the multi-port. As I've said, this is plaguing any thru on ALL ports. The DUT in this case is a small thru trace on one of our calibration boards. Is there anything else I can investigate in order to isolate the problem, or is there any idea as to what is going on? I've also supplied the .s2p files I took, though I can supply an .s16p file where I caught this behavior as well. Any help would be appreciated 附件
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你知道你的多端口测试集是否有选项001或002吗？
您正在测量的DUT是多少？ 所有端口对之间的差异是否一致？ 你有全球Delta-Match Cal吗？ （查看你的校准集）。 此测试集的一个问题是，对于某些端口组合，源匹配会根据源端口而变化。 更改大约为-40 dB，这通常不会导致问题，但对于匹配不佳的设备，可能会导致S21显示错误。 原因是耦合后面的开关位置发生变化，导致端口匹配发生变化。 当交换机设置为上端口时，它有一个匹配，当交换机切换到下端口时，它有另一个匹配; 匹配的差异是10 dB量级的误差，但它被耦合器的32 dB双向损耗“隐藏”。 在选项001或002中，在耦合端口和开关之间添加放大器，因此匹配变化不会出现在测试端口，这样可以改善剩余源匹配。 但我不确定这个错误是否出现在2端口设备上，通常你会在多端口设备上看到它，因为它是匹配变化的未使用端口。 以上来自于谷歌翻译 以下为原文 Do yo know if your multiport test set has option 001 or 002? What is the DUT that you are measuring? Is the difference consistent between all port pairs? Do you have a Global Delta-Match Cal? (Look in your calsets). One issue with this test set is that for some port combinations, the source match changes depending on the sourcing port. The change is on the order of -40 dB which generally doesn't cause a problem, but for devices with poor match, it can cause S21 to show errors. The cause is a change in the switch position behind the couple which causes the port match to change. When the switch is set to the upper port it has one match and when the switch is switched to the lower port, it has another match; the difference in match is an error on the order of 10 dB, but it is "hidden" by the 32 dB two way loss of the coupler. In option 001 or 002, an amplifier is added between the coupled port and the switch, so the match variation doesn't show up at the test port, and this improves the residual source match. But I'm not sure this error shows up oon a 2 port device, typically you see it on a multiport device as it is the non-used port whose match changes. |
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不，我们没有选项001或002。 无论DUT如何，效果都是一样的，但是对于诊断，我一直在使用我们在一组测试板上的直通迹线。 所有端口对之间的差异相对一致。 测量我们在~225 MHz处的“光点”差异在所有对上大约为0.05-0.07 dB。 我们在一些正常的DUT（连接到无源电缆的测试板）上发现差异性的“光点”，这促使我调查这个问题。 我们没有全球Delta-Match Cal，因为我认为这不是ECal所必需的。 一般来说，我们从来没有遇到使用以ECal单位为特征的定义的thrus的问题，但如果这是我应该调查的区域，我愿意接受建议。 我们已经使用这个多端口几年了，我不记得曾经在它上面看过这样的东西。 我知道我们过去至少发送过3-4次电源漏洞问题，但对我来说这是一个非常独特的问题。 我附上了一个.s16p文件，显示了我们开始看到这个问题的一个例子。 有人告诉我，我们的1米和3米DUT非常明显。 我想我不确定我们是否只是遇到了我们以前从未见过的12端口扩展的限制，或者是否还有其他的东西在我错过了。 我们还有两个N5245A和一个12端口扩展我用来验证。 再次感谢您的帮助。编辑：mhreider于2012年12月4日中午12:00 以上来自于谷歌翻译 以下为原文 No, we do not have option 001 or 002 on it. The effect is the same regardless of the DUT, but for diagnosing I've been using a thru trace we have on a set of our test boards. The difference is relatively consistent between all port pairs. Measuring the difference of the "blip" we have at ~225 MHz is roughly 0.05-0.07 dB across all pairs. We caught the "blip" measuring differentially on some of our normal DUTs (test boards connected to passive cables), which is what prompted me to investigate the issue. We don't have a Global Delta-Match Cal though, as I though that wasn't required for an ECal. Generally we've never had problems using the defined thrus characterized by the ECal units, but if this is an area I should investigate, I'm open to suggestions. We have been using this multiport for a few years now, and I don't remember ever seeing anything quite like this on it before. I know we have sent it in at least 3-4 times in the past for issues with power holes, but this is a very unique issue to me. I attached an .s16p file showing an example of where we began to see this problem. I was told it was very apparent on our 1 meter and 3 meter DUTs. I guess I'm not sure if we're just running into a limitation of the 12-port extension we hadn't seen before, or if there was something else at play that I've missed. We also have two N5245As and a 12-port extension I've used to verify against. Thanks again for the help. Edited by: mhreider on Dec 4, 2012 12:00 PM 附件
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xuxuede 发表于 2019-4-30 11:51 如果您可以通过电子邮件（joel_dunsmore@agilent.com）与我联系，我会让您联系我们的测试设置固件人员，他们可能会对您的情况有所帮助。 以上来自于谷歌翻译 以下为原文 If you can contact me via email (joel_dunsmore@agilent.com), I will put you in contact with one of our test-set firmware guys who might have a fix for your situation. |
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