[问答]

石英晶体阻抗测量哪种方法好？

问答对人有帮助，内容完整，我也想知道答案 0 大家好，我正在研究一些金（或铂）电镀石英晶体的阻抗行为，其频率范围为5到10 MHz。在过去，我为此目的使用了旧的HP 4192A，但数据采集非常复杂，每次扫描的采集时间对我来说太低了。因此，我最近购买了E5061B网络分析仪，其中包括以下选项（硬盘除外）：a）E5061B-3L5 LF-RF网络分析仪，带有直流偏置源，-1E5高稳定时基和-005阻抗分析。直到现在我正在使用增益相位系列来测量这个DUT的阻抗，但我不确定是最好的方法。确实，还有其他像S1系列通过或反射以及分流通过的那些？有人可以为我的DUT推荐最好的方法吗？非常感谢提前。安东尼奥以上来自于谷歌翻译以下为原文 Hi all, i'm currently studying the impedance behavior of some gold (or platinum) plated quartz crystals which frequency ranges from 5 to 10 MHz. In the past i used for this purpose an old HP 4192A but data acquisition was a lot complicated and the acquisition time for each scan was too low for my purposes. Accordingly, I have recently purchased an E5061B Network Analyzer with the following option (apart the hard disk): a) E5061B-3L5 LF-RF network analyzer with DC bias source, -1E5 high stability timebase and -005 impedance analysis. Till now i'm using the gain-phase serie-thru approach to measure the impedance of this DUT but i'm unsure is the best approach. Indeed, there are other like the S1 series series-thru or reflection as well as the shunt-thru ones? Can someone recommend the best approach for my DUT? Thank so much in advance. Antonio 0
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答案对人有帮助，有参考价值 0 如果你想测量高达\| Z \| 在谐振器的反谐振频率Fa的范围内，串联方法是最好的方法，因为它覆盖了更高的\| Z \| 范围比反射和分流通过方法。由于您的谐振器小于10 MHz，您可以使用增益相位测试端口（最高30 MHz），这更便于连接4端子对（4 BNC）阻抗测试夹具，而不是S参数测试港口。让我总结一下制作更好的晶体测量的技巧： - 为了精确测量晶体阻抗CI（= \| Z \|在串联谐振零相位点Fr），需要在Fr周围有足够的测量点（足够的频率分辨率）。扫描速度arnoud Fr（+/- 45度区域）也不应该非常快。通常建议将测量范围设置为仅覆盖Fr区域的窄范围（不包括Fa区域），并将IFBW设置为100 Hz的窄值（以降低测量速度）。 - 另一方面，为了执行包括C0的4元件等效电路分析，应该以更宽的跨度执行测量，包括串联谐振Fr和反谐振Fa区域，因为C0是从Fa周围的测量数据中提取的。 - 如果使用带引线的50欧姆电阻器来执行4TP夹具上的开路/短路/负载阻抗校准，请选择“引线50欧姆”的校准套件，其定义包括含铅50欧姆电阻器的近似残余电感值。 - 晶体谐振器通常具有交流电压电平依赖性，您可能想知道施加到DUT的电压。在增益相位串联方法中，与DUT串联的总阻抗为100欧姆（源输出-Z：50欧姆+接收器T输入-Z：50欧姆）。当按下电源软键时指示的源功率电平Vsrc（** mV @ 50ohm）表示当源端口终止时，50欧姆终端上的交流电压。因此开路电压为2 * Vsrc，您可以计算施加到CI的电压为Vci =（Vsrc * 2）* CI /（CI + 100）。以下研讨会资料（第30页）显示了使用E5061B的crsytal谐振器测量示例（在此示例中，不是增益相位串联方法，而是反射方法）：http：//cp.literature.agilent.com/ litweb / pdf / 5991-0213EN.pdf致敬，Yasuhiro Mori /安捷伦科技公司以上来自于谷歌翻译以下为原文 If you wants to measure up to high \|Z\| range around the resonator's anti-resonant frequency Fa, the series-thru method is the best approach because it covers higher \|Z\| range than reflection and shunt-thru method. As your resonator is less than 10 MHz, you can use the gain-phase test port (up to 30 MHz) which is more comvenient for connecting the 4-terminal-pair (4 BNC) impedance test fixtures, rather than S-parameter test port. Let me summerize tips for making better crystal measurements: - To accurately measure the crystal impedance CI (= \|Z\| at the series resonant zero-phase point Fr ), it is necessary to have sufficient measurement points (sufficient freq resolution) around Fr and also the sweep speed arnoud Fr (+/-45 degree area) should not be very fast. Generally it is recommend to set the measurement span to a narrow range just covering the Fr area (without including the Fa area) and to set the IFBW to a narrow value like 100 Hz (to slow down the measurment speed). - On the other hand, to perform the 4-element equivalent circuit analysis including C0, the measurement should be performed with a wider span including both series-resonant Fr and anti-resonant Fa areas because C0 is extracted from the measured data around Fa. - If you use the leaded 50 ohm resistor to perform the open/short/load impedance cal on the 4TP fixture, selet the cal kit "leaded 50 ohm" whose definition includes an approximate residual inductance value of the leaded 50 ohm resistor. - Crystal resonators generally have AC voltage level dependency, and you may want to know the voltage applied to the DUT. In the gain-phase series-thru method, total impedance existing in series with the DUT is 100 ohm (source output-Z: 50 ohm + receiver T input-Z: 50 ohm). The source power level Vsrc (** mV @50ohm) indicated when pressing the power softkey means the AC voltage across the 50 ohm termination when the source port is terminated with it. So the open voltage is 2Vsrc, and you can calculate the voltage applied to CI as Vci = (Vsrc2)*CI/(CI+100). The following seminar material (page-30) shows a crsytal resonator measurement example using the E5061B (in this example, not the gain-phase series-thru method but the reflection method): http://cp.literature.agilent.com/litweb/pdf/5991-0213EN.pdf Best regards, Yasuhiro Mori / Agilent Technologies

2019-7-22 10:36:25 评论举报陈炜